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It is possible to observe cross-sections while observing FIB processing in real time.
A new method for structural analysis of electronics products manufactured with nanoscale precision, such as semiconductor devices, MEMS, and TFTs: We propose cross-beam FIB for cross-sectional observation.
![[Data] Cross-sectional observation of solar cell modules](https://image.mono.ipros.com/public/product/image/cc1/2000561879/IPROS02201267418243097889.png?w=280&h=280)
We have published cross-sectional observations of the fracture surface and elemental maps of the fracture area!
This document introduces the cross-sectional observation of solar cell modules. An inspection was conducted on a solar cell module that underwent thermal shock testing, and upon performing a cross-sectional observation of the identified abnormal areas, it was confirmed that the interconnector solder joint had fractured. [Contents] - Cross-sectional observation of the fracture - Element map of the fracture *For more details, please refer to the PDF document or feel free to contact us.
It is possible to confirm the cross-sectional structure and elemental distribution without damaging fine structures such as grain separation!
We would like to introduce our "Cross-sectional Observation of Automotive Bumper Coating Films." The coating film of automotive bumpers has a multi-layer structure using several types of paint. In general mechanical polishing for cross-sectional observation, issues such as the detachment of added fine particles occur, making it difficult to confirm the correct structure. By using the ion milling method (Ar+ ion beam) for processing, we can observe the cross-sectional structure and elemental distribution without damaging the fine structures such as detachment. 【Features】 ■ SEM observation allows for clear confirmation of the multi-layer structure of the coating film and the added fine particles. ■ By combining elemental analysis, we can clearly confirm the distribution of each added particle. *For more details, please download the PDF or feel free to contact us.
It is possible to grasp the shape and see approximate dimensions! Strongly supports manufacturing.
At our company, regardless of the lens or lens unit, we can understand the shape and approximate dimensions through cross-sectional observation. For products that fit within approximately φ3cm × 3cm, we are open to consultations about measuring specified areas, from resin hardening to cut samples, if requested. Tokyo Shinbi Optical Electronics strongly supports your manufacturing with the various experiences and know-how cultivated in micro-lens development. 【Case Overview】 ■ Measurement Items - Cross-sectional observation - Dimensional measurement ■ Measuring Instruments - Polishing machine "Struers TegraSystem" - Measuring microscope "Nikon MM-800/LFA" *For more details, please refer to the PDF document or feel free to contact us.
